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Ultrafast X-ray Sources and Detectors (Proceedings of Spie), by Zenghu Chang, George A. Kyrala, Jean-Claude Kieffer
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- Sales Rank: #17378411 in Books
- Published on: 2007-09-13
- Original language: English
- Dimensions: .0" h x .0" w x .0" l, .0 pounds
- Binding: Paperback
- 166 pages
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