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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI: 23-24 January 2012, San Francisco, California, Unit
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- Published on: 2012-04-15
- Dimensions: 9.02" h x 5.98" w x .0" l, .0 pounds
- Binding: Paperback
- 174 pages
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